An Introduction to Pattern Recognition and Machine Learning

1. Auflage 2022
ISBN: 978-3-030-95993-7
Verlag: Springer International Publishing

Buch, Englisch, 471 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 904 g

The domains of Pattern Recognition and Machine Learning have experienced exceptional interest and growth, however the overwhelming number of methods and applications can make the fields seem bewildering. This text offers an accessible and conceptually rich introduction, a solid mathematical development emphasizing simplicity and intuition. Students beginning to explore pattern recognition do not need a suite of mathematically advanced methods or complicated computational libraries to understand and appreciate pattern recognition; rather the fundamental concepts and insights, eminently teachable at the undergraduate level, motivate this text. This book provides methods of analysis that the reader can realistically undertake on their own, supported by real-world examples, case-studies, and worked numerical / computational studies.

Zielgruppe

Upper undergraduate

Autoren/Hrsg.

Fieguth, Paul

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Signalverarbeitung
• Mathematik | Informatik EDV | Informatik Daten / Datenbanken Data Mining
• Naturwissenschaften Physik Angewandte Physik Soziophysik, Wirtschaftsphysik
• Mathematik | Informatik EDV | Informatik Informatik Künstliche Intelligenz Mustererkennung, Biometrik

Inhaltsverzeichnis

Chapter 1. Overview.- Chapter 2. Introduction to Pattern Recognition.- Chapter 3. Learning.- Chapter 4. Representing Patterns.- Chapter 5. Feature Extraction and Selection.- Chapter 6. Distance-Based Classification.- Chapter 7. Inferring Class Models.- Chapter 8. Statistics-Based Classification.- Chapter 9. Classifier Testing and Validation.- Chapter 10. Discriminant-Based Classification.- Chapter 11. Ensemble Classification.- Chapter 12. Model-Free Classification.- Chapter 13. Conclusions and Directions.

Über Autor(innen)

Paul Fieguth received the B.A.Sc. degree from the University of Waterloo, Canada, in 1991 and the Ph.D. degree from the Massachusetts Institute of Technology (MIT), United States, in 1995, both degrees in electrical engineering. He joined the faculty at the University of Waterloo in 1996, where he is currently Professor in Systems Design Engineering. He is a co-director of the Vision and Image Processing research group, where his research interests broadly involve machine learning for computer vision and statistical image processing. Specific interests include hierarchical algorithms for large problems, particularly in simplifying modelling and interpretation. In addition to this text, he is also the author on textbooks on Statistical Image Processing and Complex Systems.