Duda / Hart / Stork Pattern Classification

2. Auflage 2012
ISBN: 978-1-118-58600-6
Verlag: John Wiley & Sons
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 688 Seiten, E-Book

The first edition, published in 1973, has become a classicreference in the field. Now with the second edition, readers willfind information on key new topics such as neural networks andstatistical pattern recognition, the theory of machine learning,and the theory of invariances. Also included are worked examples,comparisons between different methods, extensive graphics, expandedexercises and computer project topics.
An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment.

Autoren/Hrsg.

Duda, Richard O.

Hart, Peter E.

Stork, David G.

Inhaltsverzeichnis

Bayesian Decision Theory.
Maximum-Likelihood and Bayesian Parameter Estimation.
Nonparametric Techniques.
Linear Discriminant Functions.
Multilayer Neural Networks.
Stochastic Methods.
Nonmetric Methods.
Algorithm-Independent Machine Learning.
Unsupervised Learning and Clustering.
Appendix.
Index.

Über Autor(innen)

RICHARD O. DUDA, PhD, is Professor in the Electrical EngineeringDepartment at San Jose State University, San Jose,California.
PETER E. HART, PhD, is Chief Executive Officer and President ofRicoh Innovations, Inc. in Menlo Park, California.
DAVID G. STORK, PhD, is Chief Scientist, also at Ricoh Innovations,Inc.