Critical Phenomena at Surfaces and Interfaces

Evanescent X-Ray and Neutron Scattering
Softcover Nachdruck of the original 1. Auflage 1992
ISBN: 978-3-662-14975-1
Verlag: Springer

Buch, Englisch, Band 126, 149 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 254 g

Reihe: Springer Tracts in Modern Physics

This book deals with the application of grazing angle x-ray
and neutron scattering to the study of surface-induced
critical phenomena. With the advent of even more advanced
synchrotron radiation sources and new sophisticated
instrumentation this novel technique is expected to
experience a boom.
The comprehensive and detailed presentation of theoretical
and experimental aspects of the scattering of evanascent
x-ray and neutron waves inside a solid makes this book
particularly useful for tutorial courses.
Particular emphasis is put on the use of this technique to
extract microscopic information (correlation functions) from
the real structure of a surface, from buried and magnetic
interfaces and from surface roughness.

Zielgruppe

Research

Autoren/Hrsg.

Dosch, Helmut

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik
• Naturwissenschaften Chemie Physikalische Chemie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffprüfung

Inhaltsverzeichnis

Evanescent X-ray scattering.- Evanescent neutron scattering.- Semi-infinite critical systems.- Surface effects at first order phase transitions.