Volume 1 ¿ Basic and Advanced Devices
Buch, Englisch, 211 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 3868 g
ISBN: 978-3-319-35047-9
Verlag: Springer International Publishing
This book describes the basic technologies and operation principles of charge-trapping non-volatile memories. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved as well as the fundamental properties of the technology. Modern material properties used as charge-trapping layers, for new applications are introduced.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Halb- und Supraleitertechnologie
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Biomaterialien, Nanomaterialien, Kohlenstoff
Weitere Infos & Material
Preface
Chapter 1 - Introduction to NVM devices
Panagiotis Dimitrakis
Chapter 2 - A synopsis on the state of the art of NAND memories
Kirk Prall, Nirmal Ramaswamy, Akira Goda
Chapter 3 - Charge-trap memories with ion beam modified ONO stacks
Vassilios Ioannou-Sougleridis, Panagiotis Dimitrakis and P. Normand
Chapter 4 - 3D NAND Flash Architectures
Hang-Ting Lue
Chapter 5 - Quantum dot Nonvolatile Memories
Panagiotis Dimitrakis, Vassilios Ioanou-Sougleridis, P. Normand
Chapter 6 - Two-Terminal Organic Memories with Metal or Semiconductor Nanoparticles
Jianyong Ouyang




