Buch, Englisch, Band 42, 140 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 3672 g
Design and TCAD Simulation
Buch, Englisch, Band 42, 140 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 3672 g
Reihe: Springer Series in Advanced Microelectronics
ISBN: 978-94-007-6339-5
Verlag: Springer Netherlands
High Mobility and Quantum Well Transistors: Design and TCAD Simulation investigates planar bulk Germanium pFET technology in chapters 2-4, focusing on both the fabrication of such a technology and on the process and electrical TCAD simulation. Furthermore, this book shows that Quantum Well based transistors can leverage the benefits of these alternative materials, since they confine the charge carriers to the high-mobility material using a heterostructure. The design and fabrication of one particular transistor structure - the SiGe Implant-Free Quantum Well pFET – is discussed. Electrical testing shows remarkable short-channel performance and prototypes are found to be competitive with a state-of-the-art planar strained-silicon technology. High mobility channels, providing high drive current, and heterostructure confinement, providing good short-channel control, make a promising combination for future technology nodes.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
List of Abbreviations and Symbols.- 1 Introduction.- 2 S/D Junctions in Ge: experimental.- 3 TCAD Simulation and Modeling of Ion Implants in Germanium.- 4 Electrical TCAD Simulations and Modeling in Germanium.- 5 Investigation of Quantum Well Transistors for Scaled Technologies.- 6 Implant-Free Quantum Well FETs: Experimental investigation.- 7 Conclusions Future Work and Outlook.- Bibliography.- List of Publications.