Crasemann Experimental Approaches and Applications

1. Auflage 2013
ISBN: 978-1-4832-6830-9
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 232 Seiten, Web PDF

Atomic Inner-Shell Processes, Volume II: Experimental Approaches and Applications focuses on the physics of atomic inner shells, with emphasis on experimental aspects including the use of radioactive atoms for studies of atomic transition probabilities. Surveys of modern techniques of electron and photon spectrometry are also presented, and selected practical applications of inner-shell processes are outlined. Comprised of six chapters, this volume begins with an overview of the general principles underlying the experimental techniques that make use of radioactive isotopes for inner-shell transition measurements. The discussion then turns to electron spectrometry, its instrumentation as well as basic and operational principles; X-ray diffraction spectrometry, paying particular attention to types of X-ray spectrometers and general characteristics of crystal spectrometers; spectrometry with solid-state detectors; and proportional-counter spectrometry. The final chapter considers some practical applications of inner-shell ionization phenomena, with particular reference to X-ray fluorescence analysis and astrophysics. This book should be valuable to physicists and other scientists who plan to engage in research on atomic inner-shell processes.

Autoren/Hrsg.

Crasemann, Bernd

Inhaltsverzeichnis

1;Front Cover;1
2;Experimental Approaches and Applications;4
3;Copyright Page ;5
4;Table of Contents;6
5;List of Contributors;8
6;Contents of Volume I;9
7;Preface;10
8;Chapter 1. Inner-Shell Transition Measurements with Radioactive Atoms;14
8.1;1.1. Introduction;15
8.2;1.2. Fluorescence, Auger, and Coster–Kronig Yields;15
8.3;1.3. Decay of Double Inner-Shell Vacancy States;31
8.4;1.4. Auger-Electron Intensities;36
8.5;1.5. Relative x-Ray Intensities;38
8.6;1.6. Measurement of Widths;40
8.7;1.7. Directional Correlations;41
8.8;References;43
9;Chapter 2. Electron Spectrometry;46
9.1;2.1. Introduction;47
9.2;2.2. Instrumentation;49
9.3;2.3. Some Basic and Operational Principles;56
9.4;2.4. Photoelectron Spectrometry;64
9.5;2.5. Auger-Electron Spectrometry;78
9.6;2.6. The All-Electron Experiment;86
9.7;2.7. Miscellaneous;89
9.8;References;90
10;Chapter 3. x-Ray Diffraction Spectrometry;96
10.1;3.1. Introduction;97
10.2;3.2. Types of x-Ray Spectrometers;100
10.3;3.3. General Characteristics of Crystal Spectrometers;107
10.4;3.4. Diffraction by a Plane Crystal;109
10.5;3.5. Instrumental Effects in Two-Crystal Spectrometers;116
10.6;3.6. Instrumental Effects in Bent-Crystal Spectrometers;123
10.7;References;131
11;Chapter 4. Spectrometry with Solid-State Detectors;136
11.1;4.1. Introduction;137
11.2;4.2. Basic Characteristics of x-Ray and Electron Spectrometers;138
11.3;4.3. x-Ray Spectrometers;163
11.4;4.4. Electron Spectrometers;170
11.5;4.5. Concluding Remarks;174
11.6;References;176
12;Chapter 5. Proportional-Counter Spectrometry;182
12.1;5.1. Introduction;182
12.2;5.2. Gas Multiplication;184
12.3;5.3. Energy Resolution;186
12.4;5.4. Risetime and Pulse Shape;187
12.5;5.5. Wall Effects;188
12.6;5.6. Spurious Counts and Afterpulses;189
12.7;5.7. Single-Electron Spectrometry;189
12.8;5.8. Spectrometry of Few-Electron Events;190
12.9;5.9. Position-Sensitive Proportional Counters;192
12.10;5.10. Proportional Counters with Special Innovations and Applications;193
12.11;5.11. Conclusion;196
12.12;References;197
13;Chapter 6. Some Practical Applications of Inner-Shell lonization Phenomena ;200
13.1;6.1. Introduction;200
13.2;6.2. x-Ray Fluorescence Analysis;202
13.3;6.3. Astrophysical Applications;211
13.4;References;215
14;Author Index;218
15;Subject Index;229