Buch, Englisch, 670 Seiten, Format (B × H): 159 mm x 233 mm, Gewicht: 1220 g
Buch, Englisch, 670 Seiten, Format (B × H): 159 mm x 233 mm, Gewicht: 1220 g
ISBN: 978-0-19-504275-7
Verlag: OXFORD UNIV PR
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopies and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, minerology, semiconductors, and metals. Contributors include: J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.
Autoren/Hrsg.
Fachgebiete
- Naturwissenschaften Chemie Chemie Allgemein Toxikologie, Gefahrstoffe, Sicherheit in der Chemie
- Naturwissenschaften Chemie Chemie Allgemein Chemometrik, Chemoinformatik
- Technische Wissenschaften Technik Allgemein Modellierung & Simulation
- Naturwissenschaften Chemie Chemie Allgemein Chemische Labormethoden, Stöchiometrie
- Interdisziplinäres Wissenschaften Wissenschaften: Forschung und Information Forschungsmethodik, Wissenschaftliche Ausstattung
- Naturwissenschaften Physik Physik Allgemein Experimentalphysik
Weitere Infos & Material
Imaging; Imaging theory; Elastic scattering of electrons by crystals; Elastic scattering theory; Inelastic electron scattering; Inelastic scattering II; Techniques closely related to high resolution electron microscopy; Calculation of diffraction patterns and images for Fasr electrons; Mineralogy; Contributions of high resolution electron microscopy studies to solid state chemistry; Materials science: metals, ceramics, and semiconductors; Practical high resolution electron microscopy; Surfaces; Highly disordered materials
