Brindley Modern Electronic Test Equipment

2. Auflage 2014
ISBN: 978-1-4832-7988-6
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 270 Seiten, Web PDF

Modern Electronic Test Equipment

Keith is a freelance journalist whose whole life (well, apart from the wife, the kids, the music and the mountain bike) is computers. He's been writing about them (computers, that is) for over 18 years, in the meantime working as a teacher, lecturer, engineer, journalist and finally (for the last 12 years) freelance in the computing field. He fondly remembers his first contacts with the Commodore Pet, the various Sinclair oddities, the BBC, PC-DOS, MS-DOS, the Mac, and the various incarnations of Windows. He dreams of new software and hardware, he realises that writing about computers makes little compared to making computers or writing the software for them, he is fully committed to passing his experience along to and making computer-life easier for his readers, yet still enjoys what he's doing. Which can't be all bad!

Autoren/Hrsg.

Brindley, Keith

Inhaltsverzeichnis

1;Front Cover
;1
2;Modern Electronic Test Equipment;4
3;Copyright Page;5
4;Table of Contents;6
5;Preface;8
6;Part One: Equipment and Principles;10
6.1;Chapter 1. Introduction;12
6.1.1;The past;12
6.1.2;The present;12
6.1.3;The future;13
6.1.4;Explanation of terms;15
6.1.5;Book layout and description;16
6.2;Chapter 2. Analog meters;18
6.2.1;General-purpose meters;19
6.2.2;Specialised analog meters;28
6.3;Chapter 3. Digital meters;35
6.3.1;Signals and functions;36
6.3.2;Analog-to-digital conversion;40
6.3.3;Displays;46
6.3.4;Advantages of digital meters;47
6.4;Chapter 4. Oscilloscopes;51
6.4.1;What the oscilloscope displays;52
6.4.2;The basic oscilloscope;54
6.4.3;Specifications;62
6.4.4;Oscilloscope accessories;64
6.4.5;Equipment accuracy;67
6.4.6;New developments;70
6.5;Chapter 5. Signal sources;71
6.5.1;Low frequency oscillators;73
6.5.2;Signal generators;79
6.6;Chapter 6. Frequency, time and event counters;90
6.6.1;High frequency measurement;91
6.6.2;Low frequency measurement;93
6.6.3;Equipment and operation;95
6.6.4;Errors;98
6.7;Chapter 7. Spectrum analysers;102
6.7.1;Spectrum analyser types;104
6.7.2;Display characteristics;109
6.7.3;Equipment specifications and accuracy;114
6.8;Chapter 8. Logic analysers;116
6.8.1;Features;119
6.8.2;Main modes of use;122
6.9;Chapter 9. Time domain reflectometers;127
6.9.1;Metallic time domain reflectometers;128
6.9.2;Using the metallic time domain reflectometer;135
6.9.3;Optical time domain reflectometers;139
6.10;Chapter 10. Automatic test equipment;143
6.10.1;Basic methods of automatic test equipment;147
6.10.2;Types of automatic test equipment;152
6.11;Chapter 11. Buses;164
6.11.1;Bus data communications levels;166
6.11.2;V24/EIA232;169
6.11.3;EIA422/EIA423;169
6.11.4;EIA449;172
6.11.5;S100;172
6.11.6;Multibus;178
6.11.7;PC expansion bus;181
6.11.8;STE;184
6.11.9;VMEbus;185
6.11.10;GPIB;187
6.11.11;VXIbus;197
7;Part Two: Applications and Measurement Techniques;212
7.1;Chapter 12. Measurands and measurement equipment;214
7.1.1;Aerials or antennas;214
7.1.2;Amplifiers (untuned);219
7.1.3;Capacitance;224
7.1.4;Current;228
7.1.5;Diode parameters;229
7.1.6;Distortion;231
7.1.7;Frequency;231
7.1.8;Impedance;232
7.1.9;Inductance;235
7.1.10;Light;236
7.1.11;Noise;236
7.1.12;Optical fibres;238
7.1.13;Phase;240
7.1.14;Pulse parameters;242
7.1.15;Resistance;243
7.1.16;SCR parameters;245
7.1.17;Signal-to-noise ratio;245
7.1.18;Time;245
7.1.19;Transmission lines;248
8;Appendix 1: Displays;252
8.1;Analog displays - the moving-coil movement;252
8.2;Analog/digital displays - the cathode ray tube (CRT);255
8.3;Storage CRT;256
8.4;Digital displays;258
9;Appendix 2: Optical fibres;263
9.1;Transmission of light;264
9.2;Optical fibre types;268