Brindley Automatic Test Equipment

1. Auflage 2013
ISBN: 978-1-4831-0115-6
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 240 Seiten, Web PDF

Automatic Test Equipment provides a clear and concise discussion of automatic test equipment. The book is comprised of nine chapters that deal with both concepts and standards. Chapter 1 reviews the term of automatic test equipment, while Chapter 2 covers the types of test equipment. Chapter 3 discusses fixture, and Chapters 4 and 5 talk about the strategies, methods, and processes used by automatic test equipment systems. The book also deals with computer and instrument buses, and then covers general-purpose interface bus. The last two chapters discuss the VMEbus and VXIbus. The text will be of great use to practitioners from different fields who wish to utilize automatic test equipment in their work.

Keith is a freelance journalist whose whole life (well, apart from the wife, the kids, the music and the mountain bike) is computers. He's been writing about them (computers, that is) for over 18 years, in the meantime working as a teacher, lecturer, engineer, journalist and finally (for the last 12 years) freelance in the computing field. He fondly remembers his first contacts with the Commodore Pet, the various Sinclair oddities, the BBC, PC-DOS, MS-DOS, the Mac, and the various incarnations of Windows. He dreams of new software and hardware, he realises that writing about computers makes little compared to making computers or writing the software for them, he is fully committed to passing his experience along to and making computer-life easier for his readers, yet still enjoys what he's doing. Which can't be all bad!

Autoren/Hrsg.

Brindley, Keith

Inhaltsverzeichnis

1;Front Cover;1
2;Automatic Test Equipment;4
3;Copyright Page;5
4;Table of Contents;6
5;Preface;8
6;Chapter 1. What is automatic test equipment?;12
6.1;Types of automatic test equipment;13
6.2;Fixtures;13
6.3;Test strategies;13
6.4;Test methods and processes;14
6.5;Basic methods of creating automatic test equipment;14
6.6;Advantages of automatic test equipment systems;18
7;Chapter 2. Types of automatic teste quipment;21
7.1;Component parts test equipment;22
7.2;Unpackaged assembly test equipment;24
7.3;Packaged assembly test equipment;28
7.4;Maintenance and service tests;29
7.5;Automatic test equipment administration;29
7.6;Type and availability of automatic test equipment;32
8;Chapter 3. Fixtures;33
8.1;Bed-of-nails fixtures;35
8.2;Moving probe fixtures;39
8.3;Electrical considerations;41
8.4;Mechanical considerations;42
9;Chapter 4. Test strategies;49
9.1;Functional test;50
9.2;In-circuit test;51
9.3;Combinational test;55
9.4;Bench-top test;58
9.5;Design for testability;58
9.6;Ad hoc design for testability;62
9.7;Test area management systems;69
9.8;A total company test strategy;70
9.9;Economics of overall test strategy;75
10;Chapter 5. Test methods and processes;81
10.1;General processes and considerations;81
10.2;Digital testing processes and considerations;83
10.3;Digital circuits;93
10.4;Analog testing and considerations;97
11;Chapter 6. Computer and instrument buses;103
11.1;Buses;105
11.2;Available buses;107
12;Chapter 7. General-purpose interface bus;126
12.1;Bus structure;128
12.2;Devices: functions and messages;131
12.3;Interface;132
12.4;Bus operation;135
12.5;Command sequences;143
12.6;Interface messages and functions;149
12.7;Device-dependent messages;151
12.8;Devices;156
12.9;Size and speed limitations;158
12.10;Hardware;158
13;Chapter 8. VMEbus;165
13.1;Hardware essentials;166
13.2;Functional modules and data transfer bus cycles;170
13.3;Process cycles;172
13.4;Signals, lines and protocols;175
13.5;Electrical considerations;183
13.6;Side buses;185
13.7;Futurebus+ extended architecture;186
13.8;Further reading;186
14;Chapter 9. VXIbus;187
14.1;Basic VXIbus system components;188
14.2;Electrical architecture;192
14.3;System buses;199
14.4;Mechanical considerations;212
14.5;Power supplies;214
14.6;Devices and communications;215
15;Glossary;222
16;Worldwide addresses;230
17;Further reading;236
18;Index;239