Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy

Erscheinungsjahr 2017
ISBN: 978-0-323-52731-6
Verlag: Elsevier Science

Buch, Englisch, 518 Seiten, Format (B × H): 191 mm x 231 mm, Gewicht: 1021 g

Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy  presents a new method for the evaluation of the coverage distribution of randomly deposited nanoparticles, such as single-walled carbon nanotubes and Ag nanowires over the substrate (oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy (AFM).

The deposition of nanoparticles and how they aggregate in multiple layers over the substrate is one of the most important aspects of solution processed materials determining device performances. The coverage spectroscopy method presented in the book is strongly application oriented and has several implementations supporting advanced surface analysis through many scanning probe microscopy techniques. Therefore this book will be of great value to both materials scientists and physicists who conduct research in this area.

Zielgruppe

<p>Researchers working in the areas of materials science, optical engineering and physics, particularly working in the areas of nanomaterials and spectroscopy.</p>

Autoren/Hrsg.

Bottacchi, Stefano

Bottacchi, Francesca

Fachgebiete

• Technische Wissenschaften Technik Allgemein Nanotechnologie
• Naturwissenschaften Chemie Analytische Chemie Massenspektrometrie, Spektroskopie, Spektrochemie
• Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Biomaterialien, Nanomaterialien, Kohlenstoff

Inhaltsverzeichnis

Chapter I - The coverage theory and the Delta model approximation1. The physical model2. Simulations3. The coverage error theory4. Experimental verification - Part I5. A model for multiple CNT intersections6. Generalized coverage theory7. Experimental verification - Part II8. Matlab� scripts9. AFM Measured CNT height density database

Chapter II - Statistical diameter modelling and height density functions1. The general equation of the height density2. Deterministic diameter3. Uniform diameter density4. Rayleigh diameter density5. Gaussian-Harmonic (GH) diameter density6. Measured diameter density7. Summary of height statistics8. Gaussian convolution with height densities9. Comparison among statistical models

Chapter III - The generalized coverage theory and experimental verification1. Redefining the coverage physical model2. Coverage solution: "DESIGN� mode 3. Coverage solution: MEASURE mode4. CNTs with random direction5. Experimental verifications

Chapter IV - The Gaussian-Harmonic model of the substrate height density1. A new model for the substrate height2. The Gaussian-Harmonic height density3. MMSE fitting4. Application to randomized height densities5. Measurements of Silver nanowires

Über Autor(innen)

Bottacchi, Francesca
Francesca Bottacchi is currently working as a yield engineer for FlexEnable Ltd. She was a Marie Curie Early Stage Researcher at the Blackett Laboratory in the Department of Physics at the Imperial College London, UK where she obtained her PhD in experimental solid state physics as part of a EU FP7 project. Dr. Bottacchi has previously published one book and authored many peer-reviewed articles.

Bottacchi, Stefano
Stefano Bottacchi currently works as a photonic networks consultant for Fraunhofer Heinrich Hertz Institute. He has previously worked for several leading research organizations, including Infineon Technologies AG, TriQuint Semiconductor and u2t Photonics AG. Dr. Bottacchi has published three books and many peer-reviewed articles, and he is a senior member of IEEE.