Buch, Englisch, 430 Seiten, Format (B × H): 161 mm x 240 mm, Gewicht: 807 g
Reihe: Chapman & Hall/CRC Monographs on Statistics and Applied Probability
The Minimum Distance Approach
Buch, Englisch, 430 Seiten, Format (B × H): 161 mm x 240 mm, Gewicht: 807 g
Reihe: Chapman & Hall/CRC Monographs on Statistics and Applied Probability
ISBN: 978-1-4200-9965-2
Verlag: CRC Press
Comprehensively covering the basics and applications of minimum distance inference, this book introduces and discusses:
- The estimation and hypothesis testing problems for both discrete and continuous models
- The robustness properties and the structural geometry of the minimum distance methods
- The inlier problem and its possible solutions, and the weighted likelihood estimation problem
- The extension of the minimum distance methodology in interdisciplinary areas, such as neural networks and fuzzy sets, as well as specialized models and problems, including semi-parametric problems, mixture models, grouped data problems, and survival analysis.
Statistical Inference: The Minimum Distance Approach gives a thorough account of density-based minimum distance methods and their use in statistical inference. It covers statistical distances, density-based minimum distance methods, discrete and continuous models, asymptotic distributions, robustness, computational issues, residual adjustment functions, graphical descriptions of robustness, penalized and combined distances, weighted likelihood, and multinomial goodness-of-fit tests. This carefully crafted resource is useful to researchers and scientists within and outside the statistics arena.
Zielgruppe
Statisticians.
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
Introduction. Statistical Distances. Continuous Models. Measures of Robustness and Computational Issues. The Hypothesis Testing Problem. Techniques for Inlier Modification. Weighted Likelihood Estimation. Multinomial Goodness-of-fit Testing. The Density Power Divergence. Other Applications. Distance Measures in Information and Engineering. Applications to Other Models.