Scanning Tunneling Microscopy and Its Application

2. rev. Auflage Softcover version of original hardcover Auflage 2000
ISBN: 978-3-642-08500-0
Verlag: Springer

Buch, Englisch, Band 32, 370 Seiten, Previously published in hardcover, Format (B × H): 156 mm x 234 mm, Gewicht: 588 g

Reihe: Springer Series in Surface Sciences

Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.

Zielgruppe

Research

Autoren/Hrsg.

Bai, Chunli

Fachgebiete

• Technische Wissenschaften Technik Allgemein Technik: Allgemeines
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Naturwissenschaften Physik Elektromagnetismus Optik
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Maschinenbau

Inhaltsverzeichnis

1. Introduction, 2. The Tunneling Effect, 3. Spectroscopy and Spectroscopic Imaging, 4. STM Instrumentation, 5. Other Related Scanning Probe Microscopes, 6. STM Studies of Clean Surfaces, 7. Surface Adsorbates and Surface Chemistry, 8. Biological Applications, 9. Surface Modification.