Esd Protection Methodologies

From Component to System
Erscheinungsjahr 2017
ISBN: 978-1-78548-122-2
Verlag: Elsevier Science

Buch, Englisch, 284 Seiten, Format (B × H): 236 mm x 158 mm, Gewicht: 580 g

Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.

Zielgruppe

Circuit and system designers and PhD students starting in the field; failure analysis engineers

Autoren/Hrsg.

Bafleur, Marise

Caignet, Fabrice

Nolhier, Nicolas

Fachgebiete

• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Zuverlässigkeitstechnik
• Technische Wissenschaften Technik Allgemein Technische Zuverlässigkeit, Sicherheitstechnik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik

Inhaltsverzeichnis

1. ESD Standards: From Component to System 2. Characterization Techniques 3. Protection Strategies Against ESD 4. Modeling and Simulation Methods 5. Case Studies

Über Autor(innen)

Caignet, Fabrice
Fabrice Caignet is a Lecturer at Paul Sabatier University in Toulouse, France.

Bafleur, Marise
Marise Bafleur is Research Director at the Laboratory for Analysis and Architecture of Systems (LAAS-CNRS) in Toulouse, France.

Nolhier, Nicolas
Nicolas Nolhier is Professor in Electronics at Paul Sabatier University in Toulouse, France.