Al-Ahmari / Nasr / Abdulhameed | Computer-Aided Inspection Planning | Buch | 978-1-032-40231-4 | sack.de

Buch, Englisch, 366 Seiten, Format (B × H): 152 mm x 231 mm, Gewicht: 522 g

Reihe: Advanced and Additive Manufacturing Series

Al-Ahmari / Nasr / Abdulhameed

Computer-Aided Inspection Planning

Theory and Practice

Buch, Englisch, 366 Seiten, Format (B × H): 152 mm x 231 mm, Gewicht: 522 g

Reihe: Advanced and Additive Manufacturing Series

ISBN: 978-1-032-40231-4
Verlag: Taylor & Francis Ltd (Sales)


The inspection process is one of the most important steps in manufacturing industries because it safeguards high quality products and customer satisfaction. Manual inspection may not provide the desired accuracy. This book introduces and implements a new methodology and develops the supporting technologies for automated inspection planning based on Computer Aided Design (CAD) models. It also provides and implements an efficient link for automated operation based on Coordinate Measuring Machine (CMM). The link’s output is a DMIS code programming file based on the inspection planning table that is executed on CMM.
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Zielgruppe


Professional Practice & Development

Weitere Infos & Material


Computer-Based Design and Features. Methodologies of Feature Representations. Feature Extraction Techniques. Data Transfer in CAD/CAM Systems. Coordinate Measuring Machine (CMM). Computer-Aided Inspection Planning. Automatic Feature Extraction. Integration System for CAD and Inspection Planning. Application of an Integrated System for CAD and Inspection Planning.


Emad Abouel Nasr is an Associate Professor in Industrial Engineering Department, College of Engineering, King Saud University, Saudi Arabia, and Mechanical Engineering Department, Faculty of Engineering, Helwan University, Egypt. He received his PhD in Industrial Engineering from University of Houston, TX, USA, in 2005. His current research focuses on CAD, CAM, rapid prototyping, advanced manufacturing systems, supply chain management, and collaborative engineering.


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