Electron Microscopy and Analysis 2001

Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Co
1. Auflage 2001
ISBN: 978-0-7503-0812-0
Verlag: Taylor & Francis

Buch, Englisch, 529 Seiten, Format (B × H): 156 mm x 234 mm, Gewicht: 929 g

Reihe: Institute of Physics Conference Series

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.

Zielgruppe

Professional

Autoren/Hrsg.

Aindow, M.

Kiely, C. J.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

Preface Plenary Lectures HREM and Electron Crystallography Advanced SEM and Surface Science New Instrumentation, Imaging, and Analysis Ferrous Metals and Intermetallics Advanced Microanalysis and Elemental Imaging Carbons, Ceramics, and Composites Microscopy of Interfaces and Surfaces Catalysts, Sensors, and Environmental Materials Semiconductors, Superconductors, and Magnetic Materials Scanning Probe Microscopy Author Index Subject Index

Über Autor(innen)

M. Aindow. C.J. Kiely, Dept of Engineering, University of Liverpool, UK.