Advances in Imaging and Electron Physics

Erscheinungsjahr 2020
ISBN: 978-0-12-821001-7
Verlag: William Andrew Publishing

Buch, Englisch, 282 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 570 g

Advances in Imaging and Electron Physics, Volume 215, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Naturwissenschaften Physik Elektromagnetismus Optik
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

1. Intensity interferometry experiment: photon bunching in cathodoluminescence

Sophie Meuret

2. Applications of photon bunching in cathodoluminescence

Sophie Meuret

3. A quantum propagator for electrons in a round magnetic lens

Stefan Löffler, Ann-Lenaig Hamon, Denis Aubry, Peter Schattschneider

4. Progress in determining of compound composition by BSE imaging in a SEM and the relevant detector disadvantages

V.G. Dyukova, S.A. Nepijko

5. A new paradigm for FDM: cylindrically symmetric electrostatics

David Edwards Jr

6. Solutions of the Laplace equation in cylindrical coordinates, driven to 2D harmonic potentials

Igor F. Spivak-Lavrov, Telektes Zh. Shugaeva, Samat U. Sharipov

7. Characteristics of triode electron guns

R. Lauer

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.