Advances in Imaging and Electron Physics

Erscheinungsjahr 2013
ISBN: 978-0-12-407670-9
Verlag: William Andrew Publishing

Buch, Englisch, 360 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 600 g

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Technik Allgemein Technische Optik, Lasertechnologie
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Halb- und Supraleitertechnologie
• Naturwissenschaften Physik Quantenphysik Teilchenphysik
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning

Inhaltsverzeichnis

- Small Angle Scatter with Correlation, Scatter and Intermediate Functions

Jay Theodore Cremer, Jr.

- Nuclear Scatter of Neutron Spin States

Jay Theodore Cremer, Jr.

- Atomic-Resolution Core-Level Spectroscopy in the Scanning Transmission Electron Microscope

Christian Dwyer

- Image Segmentation in the Field of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classification Techniques

Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka and Maxime Carré

- Point Spread Function Engineering for Super Resolution Single- and Multi- Photon Fluorescence Microscopy

Partha Pratim Mondal and Alberto Diaspro

- Perspectives on Colour Image Processing by Linear Vector Methods using Projective Geometric Transformations

Stephen J. Sangwine

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.