Zolotoyabko | Basic Concepts of X-Ray Diffraction | E-Book | sack.de
E-Book

E-Book, Englisch, 312 Seiten, E-Book

Zolotoyabko Basic Concepts of X-Ray Diffraction


E-Book, Englisch, 312 Seiten, E-Book

ISBN: 978-3-527-68114-3
Verlag: Wiley-VCH
Format: PDF
 Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

Dieses Lehrbuch eines erfahrenen Universitätsdozenten gibt Antworten auf die Fragen, die Studierende wirklich stellen. Klare Illustrationen, eine klare Sprache und klar gegliederte, kurze Kapitel lassen keine Verständnisprobleme aufkommen.
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Autoren/Hrsg.

Zolotoyabko, Emil

Weitere Infos & Material

Preface
Introduction
 
DIFFRACTION PHENOMENA IN OPTICS
 
WAVE PROPAGATION IN PERIODIC MEDIA
 
DYNAMICAL DIFFRACTION OF PARTICLES AND FIELDS: GENERAL CONSIDERATIONS
The Two-Beam Approximation
Diffraction Profile: The Laue Scattering Geometry
Diffraction Profile: The Bragg Scattering Geometry
 
DYNAMICAL X-RAY DIFFRACTION: THE EWALD-LAUE APPROACH
Dynamical X-Ray Diffraction: Two-Beam Approximation
 
DYNAMICAL DIFFRACTION: THE DARWIN APPROACH
Scattering by a Single Electron
Atomic Scattering Factor
Structure Factor
Scattering Amplitude from an Individual Atomic Plane
Diffraction Intensity inthe Bragg Scattering Geometry
 
DYNAMICAL DIFFRACTION IN NONHOMOGENEOUS MEDIA. THE TAKAGI-TAUPIN APPROACH
Takagi Equations
Taupin Equation
 
X-RAY ABSORPTION
 
DYNAMICAL DIFFRACTION IN SINGLE-SCATTERING APPROXIMATION: SIMULATION OF HIGH-RESOLUTION X-RAY DIFFRACTION IN HETEROSTRUCTURES AND MULTILAYERS
Direct Wave Summation Method
 
RECIPROCAL SPACE MAPPING AND STRAIN MEASUREMENTS IN HETEROSTRUCTURES
 
X-RAY DIFFRACTION IN KINEMATIC APPROXIMATION
X-Ray Polarization Factor
Debye-Waller Factor
 
X-RAY DIFFRACTION FROM POLYCRYSTALLINE MATERIALS
Ideal Mosaic Crystal
Powder Diffraction
 
APPLICATIONS TO MATERIALS SCIENCE: STRUCTURE ANALYSIS
 
APPLICATIONS TO MATERIALS SCIENCE: PHASE ANALYSIS
Internal Standard Method
Rietveld Refinement
 
APPLICATIONS TO MATERIALS SCIENCE: PREFERRED ORIENTATION (TEXTURE) ANALYSIS
The March-Dollase Approach
 
APPLICATIONS TO MATERIALS SCIENCE: LINE BROADENING ANALYSIS
Line Broadening due to Finite Crystallite Size
Line Broadening due to Microstrain Fluctuations
Williamson-Hall Method
The Convolution Approach
Instrumental Broadening
Relation between Grain Size-Induced and Microstrain-Induced Broadenings of X-Ray Diffraction Profiles
 
APPLICATIONS TO MATERIALS SCIENCE: RESIDUAL STRAIN/STRESS MEASUREMENTS
Strain Measurements in Single-Crystalline Systems
Residual Stress Measurements in Polycrystalline Materials
 
IMPACT OF LATTICE DEFECTS ON X-RAY DIFFRACTION
 
X-RAY DIFFRACTION MEASUREMENTS IN POLYCRYSTALS WITH HIGH SPATIAL RESOLUTION
The Theory of Energy-Variable Diffraction (EVD)
 
INELASTIC SCATTERING
Inelastic Neutron Scattering
Inelastic X-Ray Scattering
 
INTERACTION OF X-RAYS WITH ACOUSTIC WAVES
Thermal Diffuse Scattering
Coherent Scattering by Externally Excited Phonons
 
TIME-RESOLVED X-RAY DIFFRACTION
 
X-RAY SOURCES
Synchrotron Radiation
 
X-RAY FOCUSING OPTICS
X-Ray Focusing: Geometrical Optics Approach
X-Ray Focusing: Diffraction Optics Approach
 
X-RAY DIFFRACTOMETERS
High-Resolution Diffractometers
Powder Diffractometers
 
Index

Preface
Introduction
 
DIFFRACTION PHENOMENA IN OPTICS
 
WAVE PROPAGATION IN PERIODIC MEDIA
 
DYNAMICAL DIFFRACTION OF PARTICLES AND FIELDS: GENERAL CONSIDERATIONS
The Two-Beam Approximation
Diffraction Profile: The Laue Scattering Geometry
Diffraction Profile: The Bragg Scattering Geometry
 
DYNAMICAL X-RAY DIFFRACTION: THE EWALD-LAUE APPROACH
Dynamical X-Ray Diffraction: Two-Beam Approximation
 
DYNAMICAL DIFFRACTION: THE DARWIN APPROACH
Scattering by a Single Electron
Atomic Scattering Factor
Structure Factor
Scattering Amplitude from an Individual Atomic Plane
Diffraction Intensity inthe Bragg Scattering Geometry
 
DYNAMICAL DIFFRACTION IN NONHOMOGENEOUS MEDIA. THE TAKAGI-TAUPIN APPROACH
Takagi Equations
Taupin Equation
 
X-RAY ABSORPTION
 
DYNAMICAL DIFFRACTION IN SINGLE-SCATTERING APPROXIMATION: SIMULATION OF HIGH-RESOLUTION X-RAY DIFFRACTION IN HETEROSTRUCTURES AND MULTILAYERS
Direct Wave Summation Method
 
RECIPROCAL SPACE MAPPING AND STRAIN MEASUREMENTS IN HETEROSTRUCTURES
 
X-RAY DIFFRACTION IN KINEMATIC APPROXIMATION
X-Ray Polarization Factor
Debye-Waller Factor
 
X-RAY DIFFRACTION FROM POLYCRYSTALLINE MATERIALS
Ideal Mosaic Crystal
Powder Diffraction
 
APPLICATIONS TO MATERIALS SCIENCE: STRUCTURE ANALYSIS
 
APPLICATIONS TO MATERIALS SCIENCE: PHASE ANALYSIS
Internal Standard Method
Rietveld Refinement
 
APPLICATIONS TO MATERIALS SCIENCE: PREFERRED ORIENTATION (TEXTURE) ANALYSIS
The March-Dollase Approach
 
APPLICATIONS TO MATERIALS SCIENCE: LINE BROADENING ANALYSIS
Line Broadening due to Finite Crystallite Size
Line Broadening due to Microstrain Fluctuations
Williamson-Hall Method
The Convolution Approach
Instrumental Broadening
Relation between Grain Size-Induced and Microstrain-Induced Broadenings of X-Ray Diffraction Profiles
 
APPLICATIONS TO MATERIALS SCIENCE: RESIDUAL STRAIN/STRESS MEASUREMENTS
Strain Measurements in Single-Crystalline Systems
Residual Stress Measurements in Polycrystalline Materials
 
IMPACT OF LATTICE DEFECTS ON X-RAY DIFFRACTION
 
X-RAY DIFFRACTION MEASUREMENTS IN POLYCRYSTALS WITH HIGH SPATIAL RESOLUTION
The Theory of Energy-Variable Diffraction (EVD)
 
INELASTIC SCATTERING
Inelastic Neutron Scattering
Inelastic X-Ray Scattering
 
INTERACTION OF X-RAYS WITH ACOUSTIC WAVES
Thermal Diffuse Scattering
Coherent Scattering by Externally Excited Phonons
 
TIME-RESOLVED X-RAY DIFFRACTION
 
X-RAY SOURCES
Synchrotron Radiation
 
X-RAY FOCUSING OPTICS
X-Ray Focusing: Geometrical Optics Approach
X-Ray Focusing: Diffraction Optics Approach
 
X-RAY DIFFRACTOMETERS
High-Resolution Diffractometers
Powder Diffractometers
 
Index

Emil Zolotoyabko is Professor in the Department of Materials Science and Engineering at the Technion - Israel Institute of Technology (Haifa). He is holder of the Abraham Tulin Academic Chair and recipient of the 2001 Henry Taub Prize for Academic Excellence. Emil Zolotoyabko has authored more than 160 scientific publications, three books, and four chapters in books devoted to the development of new X-ray diffraction methods and their applications for studying the structure and dynamical characteristics of different materials systems.

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