From Physics-of-Failure to Physics-of-Degradation
Buch, Englisch, 550 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 838 g
ISBN: 978-3-030-81578-3
Verlag: Springer International Publishing
This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems.
Zielgruppe
Professional/practitioner
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
Introduction to reliability.- Introduction to failure analysis methodologies.- An overview of remaining life assessment methodologies in engineering materials.- Reliability and failure of microelectronic materials and components in harsh working conditions.- Reliability and failure of solar cell materials and systems in harsh working conditions.- Electromigration-induced failures in microelectronic components.- Corrosion and degradation of metals.- Creep failures in high temperature alloys.- An overview of failures in boilers and heat exchangers in power plants.- Fatigue-related failures.- Degradation and failure of polymers.- Virtual prototyping techniques for prediction material degradation.- Health monitoring, machine learning and digital twin.-Discussions and concluding remarks.- Index.