Buch, Englisch, 330 Seiten, Format (B × H): 163 mm x 243 mm, Gewicht: 699 g
ISBN: 978-0-387-74513-8
Verlag: Springer Us
This book provides an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics. It delivers different levels of understanding of the physical phenomena that play a critical role in limitation of the semiconductor device capabilities, physical safe operating area limitation, and different scenarios of catastrophic failures in semiconductor devices. The book focuses on power semiconductor devices and self-triggering pulsed power devices for ESD protection clamps. Another unique aspect of the book is the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices. One of the major challenges the book covers is the gap in understanding of major physical regularities between the theoretical knowledge in the field of non-linier phenomena in semiconductors and the reliability and ESD protection problems in process and device development, circuit design, TCAD, and applications.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Halb- und Supraleitertechnologie
- Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie
- Technische Wissenschaften Technik Allgemein Physik, Chemie für Ingenieure
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Verbundwerkstoffe
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik
Weitere Infos & Material
Failures of Semiconductor Device.- Theoretical Basis of Current Instability in Transistor Structures.- Thermal Instability Mechanism.- Isothermal Current Instability in Silicon BJT and MOSFETs.- Isothermal Instability in Compound Semiconductor Devices.- Degradation Instabilities.- Conductivity Modulation in ESD devices.- Physical Approach to Reliability.
