Riviere / Myhra Handbook of Surface and Interface Analysis

Methods for Problem-Solving, Second Edition
2. Auflage 2009
ISBN: 978-1-4200-0780-0
Verlag: Taylor & Francis
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 671 Seiten

The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors’ firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear to have validated their assertions.

Major instrumental assets are generally funded and maintained as central facilities to help potential users make informed decisions about their appropriate use in solving analytical problem(s). Building on the popular first edition, this long-awaited second edition was motivated by the increasingly common industry view that it is more cost-effective to contract out analytical services than to maintain in-house facilities. Guided by that trend, this book focuses on developing strategic thinking for those who decide which facilities to access and where to subcontract analytical work. It covers most of the major tactical issues that are relevant at the location in which data are being produced.

New Information in this Second Edition Includes:

- Electron-optical imaging techniques and associated analytical methods

- Techniques based on synchrotron sources

- Convenient and versatile scanning probe group methods

- Scanning tunneling microscopy, biocompatible materials, and nano-structured materials

Assessing benefits and limitations of different methodologies, this volume provides the essential physical basis and common modes of operation for groups of techniques. Exploring methods for characterization and analysis of particular types of materials and/or their relevant applications—the text synergizes traditional and novel ideas to help readers develop a versatile and rational approach to surface and interface analysis.

Zielgruppe

Analytical, surface, materials, and physical chemists as well as students.

Autoren/Hrsg.

Riviere, John C.

Myhra, Sverre

Fachgebiete

• Technische Wissenschaften Technik Allgemein Technik: Allgemeines

Inhaltsverzeichnis

Introduction, J. C. Rivière and S. Myhra

Problem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. Rivière

Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. Hoflund

Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. Rading

Surface and Interface Analysis by Scanning Probe Microscopy, S. Myhra

Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments
J. M. Titchmarsh

Synchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. Prince

Quantifi cation of Surface and Near-Surface Composition by AES and XPS, S. Tougaard

Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. Titchmarsh

In-Depth Analysis/Profiling, F. Reniers and C. R. Tewell

Characterization of Nanostructured Materials, M. Werner, A. Crossley, and C. Johnston

Problem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. Martin

Problem-Solving Methods in Surface Analysis Metallurgy, R. K. Wild

Composites, P. M. A. Sherwood

Minerals, Ceramics, and Glasses, R. St. C. Smart and Z. Zhang

Catalyst Characterization, W. E. S. Unger and T. Gross

Surface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. Griesser

Adhesion Science and Technology, J. F. Watts

Electron Spectroscopy in Corrosion Science, J. E. Castle