E-Book, Englisch, 330 Seiten, eBook
Redaelli Phase Change Memory
1. Auflage 2018
ISBN: 978-3-319-69053-7
Verlag: Springer International Publishing
Format: PDF
Kopierschutz: 1 - PDF Watermark
Device Physics, Reliability and Applications
E-Book, Englisch, 330 Seiten, eBook
ISBN: 978-3-319-69053-7
Verlag: Springer International Publishing
Format: PDF
Kopierschutz: 1 - PDF Watermark
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Chapter 1. Memory overview and PCM introduction.- Chapter 2.Electrical transport in crystalline and amorphous chalcogenides.- Chapter 3.Thermal model and remarkable temperature effects on calcogenide alloys.- Chapter 4.Self-consistent numerical model.- Chapter 5.PCM main reliability features.- Chapter 6.Structure and properties of chalcogenide materials for PCM.- Chapter 7.Material Engineering for PCM Device Optimization.- Chapter 8.PCM scaling.- Chapter 9.PCM device design.- Chapter 10.PCM array architecture and management.- Chapter 11. PCM applications and an outlook to the future.