Overview
- Describes design methods that incorporate electromagnetic interference (EMI) in the design of application specific negative-feedback amplifiers
- Provides designers with a structured methodology to avoid the use of trial and error in meeting signal-to-error ratio (SER) requirements
- Equips designers to increase EMI immunity of the amplifier itself, thus avoiding filtering at the input, reducing the number of components and avoiding detrimental effects on noise and stability
- Includes supplementary material: sn.pub/extras
Part of the book series: Analog Circuits and Signal Processing (ACSP, volume 118)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
About this book
This book enables circuit designers to reduce the errors introduced by the fundamental limitations (noise, bandwith, and signal power) and electromagnetic interference (EMI) in negative-feedback amplifiers. The authors describe a systematic design approach for application specific negative-feedback amplifiers, with specified signal-to-error ratio (SER). This approach enables designers to calculate noise, bandwidth, EMI, and the required bias parameters of the transistors used in application specific amplifiers in order to meet the SER requirements.
Similar content being viewed by others
Keywords
Table of contents (8 chapters)
-
Front Matter
-
Back Matter
Authors and Affiliations
Bibliographic Information
Book Title: EMI-Resilient Amplifier Circuits
Authors: Marcel J. van der Horst, Wouter A. Serdijn, André C. Linnenbank
Series Title: Analog Circuits and Signal Processing
DOI: https://doi.org/10.1007/978-3-319-00593-5
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer International Publishing Switzerland 2014
Hardcover ISBN: 978-3-319-00592-8Published: 06 August 2013
Softcover ISBN: 978-3-319-03366-2Published: 09 August 2015
eBook ISBN: 978-3-319-00593-5Published: 23 July 2013
Series ISSN: 1872-082X
Series E-ISSN: 2197-1854
Edition Number: 1
Number of Pages: XV, 307
Topics: Circuits and Systems, Electronics and Microelectronics, Instrumentation, Electronic Circuits and Devices