Overview
- Enables readers to understand and meet challenges of electromigration, including its effects on circuit reliability
- Accessible to readers of varying backgrounds, combining practical application with theoretical underpinnings
- Multiple examples and hands-on instructions for the practical application of counter measures
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About this book
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
Keywords
Table of contents (5 chapters)
Authors and Affiliations
About the authors
Jens Lienig is the director of the Institute of Electromechanical and Electronic Design at Dresden University of Technology, Germany. He received his Ph.D. in the field of computer-aided physical design of multi-chip modules and was employed as a researcher at University of Virginia, Charlottesville and Concordia University, Montreal. Afterwards he worked as project manager at Tanner Research, Inc. and Robert Bosch GmbH.
Susann Rothe is a scientific assistant at Dresden University of Technology, Germany. She is working towards her Ph.D. in the field of migration modeling and verification with physics-based models. Her research interests include technology characterization and temperature effects for interconnect reliability.
Matthias Thiele is a scientific assistant at Dresden University of Technology, Germany. He received his Ph.D. in the field of electromigration avoidance in physical design. Currently he works on the reliability of electronic, mechatronic and photonic systems.
Bibliographic Information
Book Title: Fundamentals of Electromigration-Aware Integrated Circuit Design
Authors: Jens Lienig, Susann Rothe, Matthias Thiele
DOI: https://doi.org/10.1007/978-3-031-80023-8
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerland AG 2025
Hardcover ISBN: 978-3-031-80022-1Published: 26 February 2025
Softcover ISBN: 978-3-031-80025-2Due: 12 March 2026
eBook ISBN: 978-3-031-80023-8Published: 25 February 2025
Edition Number: 2
Number of Pages: XV, 167
Number of Illustrations: 5 b/w illustrations, 95 illustrations in colour
Topics: Circuits and Systems, Processor Architectures, Electronics and Microelectronics, Instrumentation