Lan Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory

1. Auflage 2020
ISBN: 978-981-15-2217-8
Verlag: Springer Singapore
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 145 Seiten, eBook

This book focuses on the thermophysical properties of Ge-Sb-Te alloys, which are the most widely used phase change materials, and the technique for measuring them. Describing the measuring procedure and parameter calibration in detail, it provides readers with an accurate method for determining the thermophysical properties of phase change materials and other related materials. Further, it discusses combining thermal and electrical conductivity data to analyze the conduction mechanism, allowing readers to gain an understanding of phase change materials and PCM industry simulation.

Zielgruppe

Research

Autoren/Hrsg.

Lan, Rui

Inhaltsverzeichnis

Introduction .- Establishment of the hot strip method for thermal conductivity meausurements of Ge-Sb-Te alloys.- Thermal conductivities of Ge-Sb-Te alloys.- Electrical resistivities of Ge-Sb-Te alloys.- Thermal conduction mechanisms and prediction equations of thermal conductivity for Ge-Sb-Te alloys.- Densities of Ge-Sb-Te alloys.- Summary and conclusions.

Über Autor(innen)

Ms. Rui Lan received the B.S. degree from Department of Material Science and Technology, Dalian University of Technology, Dalian, China in 2005, the M.S. and Ph.D. degrees from Department of Metallurgy and Ceramics Sciences, Tokyo Institute of Technology (TITECH), Japan in 2009 and 2012, respectively. Since 2013, she has been an Associate Professor at Department of Material Science and Technology, Jiangsu University of Science and Technology, Zhenjiang, China. Her research interests include Phase change storage materials, thermoelectric thin film materials, high-entropy alloy coating and semiconductor materials.