CMOS Test and Evaluation

A Physical Perspective
Softcover Nachdruck of the original 1. Auflage 2015
ISBN: 978-1-4939-4702-7
Verlag: Springer

Buch, Englisch, 424 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 6613 g

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Zielgruppe

Professional/practitioner

Autoren/Hrsg.

Ketchen, Mark B.

Bhushan, Manjul

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Industrielle Qualitätskontrolle
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise

Inhaltsverzeichnis

Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.

Über Autor(innen)

Manjul Bhushan is a technical consultant in New York.

Mark Ketchen is a technical consultant in Massachusetts.