E-Book, Englisch, 204 Seiten, eBook
Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
E-Book, Englisch, 204 Seiten, eBook
ISBN: 978-1-4419-6715-2
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark
Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Introduction.- Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems.- Electromagnetic Compatibility; Power Integrity.- Dependable System Technology.