Advances in Imaging and Electron Physics

Erscheinungsjahr 2002
ISBN: 978-0-12-014766-3
Verlag: ACADEMIC PR INC

Buch, Englisch, Band 124, 400 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 730 g

Reihe: Advances in Imaging and Electr

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Autoren/Hrsg.

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

V-Vector Algebra and Volterra Filters

A Brief Walk Through Sampling Theory

Kriging Filters for Space-Time Interpolation

Constructions of Orthogonal and Biorthogonal Scaling Functions and Multiwavelets Using Fractal Interpolation Surfaces

Diffraction Tomography for Turbid Media

Tree-Adapted Wavelet Shrinkage

Index

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.