Process Variations and Probabilistic Integrated Circuit Design

2012
ISBN: 978-1-4419-6620-9
Verlag: Springer

Buch, Englisch, 252 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 571 g

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.
This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

Zielgruppe

Research

Autoren/Hrsg.

Haase, Joachim

Dietrich, Manfred

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Halb- und Supraleitertechnologie
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Schaltungsentwurf
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren

Inhaltsverzeichnis

Introduction.- Physical and Mathematical Fundamentals.- Examination of Process Parameter Variations.- Methods of Parameter Variations.- Consequences for Circuits Design and Case Studies.- Conclusion.