Electrical Behavior in Harsh Environments
Buch, Englisch, 216 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 347 g
ISBN: 978-3-031-29088-6
Verlag: Springer International Publishing
This book describes in detail the semiconductor physics and the effects of the high temperatures and ionizing radiations in the electrical behavior of the Metal-OxideSemiconductor Field Effect Transistors (MOSFETs), implemented with the first and second generations of the differentiated layout styles. The authors demonstrate a variety of innovative layout styles for MOSFETs, enabling readers to design analog and RF MOSFETs that operate in a high-temperature wide range and an ionizing radiation environment with high electrical performance and reduced die area.
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Professional/practitioner
Autoren/Hrsg.
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Weitere Infos & Material
Chapter 1. Introduction.- Chapter 2. Basic concepts of the semiconductor physics.- Chapter 3. The electrical characteristics of the semiconductor at high temperatures.- Chapter 4. The MOSFET.- Chapter 5. The First Generation of the Unconventional Layout Styles for MOSFETs.- Chapter 6. The Ionizing Radiations Effects in Electrical Parameters and Figures of Merit of MOSFETs.- Chapter 7. The Ionizing Radiations Effects in Electrical Parameters and Figures of Merit of MOSFETs.- Chapter 8. The High Temperature Effects in Electrical Parameters of Mosfets and the Results Obtained of the First and Second Generation.