Test Pattern Generation Using Boolean Proof Engines

2009. Auflage 2009
ISBN: 978-90-481-2359-9
Verlag: Springer

Buch, Englisch, 192 Seiten, Format (B × H): 155 mm x 233 mm, Gewicht: 1040 g

In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.

Zielgruppe

Research

Autoren/Hrsg.

Drechsler, Rolf

Eggersglüß, Stephan

Fey, Görschwin

Tille, Daniel

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Industrielle Qualitätskontrolle
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Schaltungsentwurf
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Halb- und Supraleitertechnologie

Inhaltsverzeichnis

Preliminaries.- Boolean Satisfiability.- SAT-Based ATPG.- Learning Techniques.- Multiple-Valued Logic.- Improved Circuit-to-CNF Conversion.- Branching Strategies.- Integration into Industrial Flow.- Delay Faults.- Summary and Outlook.