Random Testing of Digital Circuits

Theory and Applications
1. Auflage 1998
ISBN: 978-0-8247-0182-6
Verlag: Taylor & Francis Inc

Buch, Englisch, 500 Seiten, Format (B × H): 159 mm x 236 mm, Gewicht: 853 g

"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

Autoren/Hrsg.

David, Rene

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise

Inhaltsverzeichnis

Random testing and built-in self-test; models for digital circuits and fault models; basic concepts and test generation methods; performance measurements for a test sequence; basic principles of random testing; random test length for combinational circuits; random test length for sequential circuits; random test length for RAMs; random test length for microprocessors; generation of random test sequences; experimental results; signature analysis; design for random testability; appendices - A - random pattern sources, B - calculation of a probability of complete fault coverage, C - finite Markov chains, D - black-box fault model, E - exact calculation of activities, F - comparing asynchronous and synchronous test, G - proofs of properties 7.1, 7.2 and 12.3, H - microprocessor Motorola 6800, I - pseudorandom testing, J - random testing of delay faults, K - subsequences of required lengths, L - diagnosis from random testing, M - conjecture about multiple faults; exercises; solutions to exercises.

Über Autor(innen)

Rene David is a Research Director at the Centre National de la recherche Scientififique working at the Instuit National Polytechnique de Grenoble, France.