Cohen / Lightbody Atomic Force Microscopy/Scanning Tunneling Microscopy 3

1. Auflage 2007
ISBN: 978-0-306-47095-0
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 218 Seiten, eBook

The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.

Zielgruppe

Research

Autoren/Hrsg.

Cohen, Samuel H.

Lightbody, Marcia L.

Inhaltsverzeichnis

A Prectical Approach to Understanding Surface Metrology and Its Applications.- Applications of Scanning Probe Microscopy in Materiias Science: Examples of Surface Modification and Quantitative Analysis.- Scanning Probe Microscopy in Biology with Potential Applications in Forensics.- Atomic Manipulation of Hydrogen on Hydrogen-Terminated Silicon Surfaces with Scanning Tunneling Microscope.- Apollo 11 Lunar Samples: an Examination Using Tapping Mode Atomic Force Microscopy and Other Microscopic Methods.- Novel Micromachined Cantilever Sensors for Scanning Near-Field Microscopy.- Imaging of Cell Surfaca Structure by Scanning Probe Microscopy.- A Force Limitation for Successful Observation of Atomic Defects: Defect Trappong of the Atomic Force Microscopy Tip.- A New Approach to Examine Interfacial Interaction Potential between a Thin Solid Film or a Droplet and a Smooth Substrate.- Nanometer-Scale Patterning of Surfaces Using Self-Assembly Chemistry. 1. Preliminary Studies of Polyaniline Electrodeposition on Self-Assembled Mixed Monolayers.- Local Rate of Electroless Copper Deposition By Scanning Tunneling Microscopy.- Atomic Force Microscopy of Olivine.- The Study of Sublimation Rates and Nucleation and Growth of TNT and Petn on Slica and Graphite Surfaces by Optical and Atomic Force Microscopy and Ellipsometry.- Peculiarities of the Scanning Tunneling Microscopy Probe on Porous Gallium Phosphide.- Influence of Doping Concentration on the Etching Rate of GaAs Studied by Atomic Force Microscopy.- Comparative Scanning Tunneling Microscopy Studies of CoFe2O4 Nanporaticles of Ferrofluids in Acidic Medium.- From Laboratory Measurements to the First In-Situ Analysis of Pristine Cometary Grains.- Synthesis of Pprbiotic Peptides and Oligonucleotides on Clay Mineral Surfaces: A Scanning Force Michoscopy Study.- Surface Structure and Intercalative Polymerization Studies of Smectite Clay Thin Films.- Atomic Force Microscopy—A New and Complementary Tool in Asphalt Research Compared to Scanning Electron Microscopy.

Leseproben

APPLICATIONS OF SCANNING PROBE MICROSCOPY IN MATERIALS SCIENCE: EXAMPLES OF SURFACE MODIFICATION AND QUANTITATIVE ANALYSIS (p. 11-12)

Peter von Blanckenhagen
Forschungszentrum Karlsruhe
Institut für Nanotechnologie
Postfach 3640, D-76021
Karlsruhe, Germany

Abstract. An overview is presented of some applications of scanning tunneling and scanning force microscopy, which indicate capabilities to research and development in nanotechnology. Results are reported of studies of surface modifications by local material deposition (A1, Au) and by mechanical material removal (Au), and of studies of surface selfdiffusion (Au), cluster dynamics (Au), thermal stability of semiconducting quantum dots (In5A15Ga), metallic multilayers (Fe/Mo), nanocrystalline materials (Au), Al-island formation on Si (1 1 1) surfaces and, finally, of cluster size distribution as well as distance dependence of tip-sample interactions for A12O3 and Fe2O3 clusters.

INTRODUCTION

In recent years, scanning probe microscopy (SPM) has become an important tool in materials science. It not only allows ultimate analyses of surface structures to be conducted, but also unique procedures to be performed, such as material deposition, initiation of chemical reactions (e.g. oxidation, lithographic reactions), mechanical structuring as well as manipulation of atoms, molecules, and clusters.1,2 Phenomena of practical importance, such as friction,3,4 adhesion5, local magnetism,6,7and surface diffusion8 can be studied on a microscopic scale. Several special types of instruments are now available for surface modification and for studying the surface properties of materials.9,10,11 Among other methods of interest in materials science are electrolytic SPM techniques,12 and SPM techniques using magnetic13 and optical14 sensors.

Descriptions of surface topography were the main objective of earlier studies of scanning probe microscopy. In the past few years, however, more and more quantitative analyses have been performed by means of scanning probe microscopes.

In this overview, results will be discussed of nine cases of surface modification and quantitative analysis by scanning tunneling (STM) and scanning force microscopes (SFM, AFM). SPM has a considerable impact now on research and development in micro- and nanotechnology. Scanning force microscopes have become important tools for controlling the topography of electronic chips in the production process, and for analysis of the topography of micromechanical components. One of the most promising applications of scanning probe microscopy is in the elucidation of the fundamentals of future nanotechnology. In nanotechnology, materials science and solid state physics on an atomic scale should meet. Also studies of chemical and biological nanosystems will contribute to the fundamentals of future nanotechnology. Two aspects are of special interest: Firstly, the self-organization processes occurring in nature and secondly, the creation of nanosystems by surface modification and by manipulation of atoms, molecules or clusters, and the characterization of such artificial systems. It is worthwhile studying biological molecular systems, such as motors, sieves, and electrical conductors, to find ways of designing nanosystems for practical use. A review is presented below of the findings made in various subjects of potential interest in nanotechnology, which were studied at our laboratory over the past few years by scanning tunneling and scanning force microscopy.

MATERIALS AND METHODS

Local material deposition was performed with the UHV-STM supplied by Perkin-Elmer, which is operated by a Nanoscope III controller. The silicon surfaces were cleaned by flashing samples to 1250° C by direct current heating. The tunneling tips were produced by mechanical cutting in air of Au or A1 wires 0.25 mm thick. The materials used for SFM studies in air must be stable in air. In most cases, Au samples were used for exploratory studies to minimize the influence of the atmosphere. The samples were examined under a commercial atomic force microscope (Multimode SPM with Nanoscope IIIA controller) in the contact mode or the tapping mode of operation. In some cases, the chemical composition of surfaces was analyzed by Auger electron spectroscopy (AES).