Life-Cycle Assessment of Semiconductors

2012
ISBN: 978-1-4899-9223-9
Verlag: Springer

Buch, Englisch, 226 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 394 g

Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions.

Zielgruppe

Research

Autoren/Hrsg.

Boyd, Sarah B.

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Industrielle Qualitätskontrolle
• Technische Wissenschaften Technik Allgemein Nachhaltigkeit, Grüne Technologien
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Halb- und Supraleitertechnologie
• Naturwissenschaften Physik Elektromagnetismus Halbleiter- und Supraleiterphysik

Inhaltsverzeichnis

1 Introduction.- 2 Semiconductor LCI Methods.- 3 Semiconductor Manufacturing Trends in Product Type and Geography.- 4 Life-cycle Energy and Global Warming Emissions of CMOS Logic.- 5 Life-cycle Assessment of CMOS Logic.- 6 Life-cycle Assessment of Flash Memory.- 7 Life-cycle Assessment of Dynamic Random Access Memory.- 8 Semiconductor LCA: The Road Ahead.