Bhushan / Ketchen CMOS Test and Evaluation

A Physical Perspective
1. Auflage 2014
ISBN: 978-1-4939-1349-7
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 424 Seiten, eBook

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Zielgruppe

Professional/practitioner

Autoren/Hrsg.

Bhushan, Manjul

Ketchen, Mark B.

Inhaltsverzeichnis

Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.

Über Autor(innen)

Manjul Bhushan is a technical consultant in New York.Mark Ketchen is a technical consultant in Massachusetts.